Close coupling

In today's world, Close coupling is a topic that generates great interest and discussion in different areas. With the advancement of technology and globalization, Close coupling has become a fundamental aspect that impacts people's daily lives, both personally and professionally. From its origins to its relevance today, Close coupling has been the subject of study and analysis by experts in various fields, generating a wide range of opinions and perspectives. In this article, we will explore different aspects related to Close coupling, from its social implications to its influence on the global economy, with the aim of offering a comprehensive and enriching vision of this topic that is so relevant today.

In atomic physics, close coupling is a quantum mechanics method to calculate the multi-electronic atomic and molecular structure from fine structure to hyperfine structure levels and dynamic processes including photoionization,[1][2] collisional excitation and ionization as well as autoionization and their inverse processes. In this method, the multi-electron systems are treated as a loosely interacting electron with a target ionic or neutral atomic as well as molecular, in which the electrons are strongly interactive with each other. The interactive atomic or molecular complex system is reduced into a so-called (N+1) problem. Based on this scheme, the inter-channel interaction, that is, configuration interactions (CI) are involved.

Integrated with other techniques, especially the matrix techniques and multi-channel quantum defect theory, close-coupling method could provide precise structural and dynamical studies of atomic and molecular systems.

References

  1. ^ Lu, K. T. (1971-08-01). "Spectroscopy and Collision Theory. The Xe Absorption Spectrum". Physical Review A. 4 (2): 579–596. Bibcode:1971PhRvA...4..579L. doi:10.1103/physreva.4.579. ISSN 0556-2791.
  2. ^ Seaton, M J (1983-02-01). "Quantum defect theory". Reports on Progress in Physics. 46 (2): 167–257. doi:10.1088/0034-4885/46/2/002. ISSN 0034-4885. S2CID 250797547.